Summary of Enhancing Industrial Transfer Learning with Style Filter: Cost Reduction and Defect-focus, by Chen Li et al.
Enhancing Industrial Transfer Learning with Style Filter: Cost Reduction and Defect-Focusby Chen Li, Ruijie Ma,…
Enhancing Industrial Transfer Learning with Style Filter: Cost Reduction and Defect-Focusby Chen Li, Ruijie Ma,…
Deciphering the Interplay between Local Differential Privacy, Average Bayesian Privacy, and Maximum Bayesian Privacyby Xiaojin…
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A comparative analysis of embedding models for patent similarityby Grazia Sveva Ascione, Valerio SterziFirst submitted…
A Novel Loss Function-based Support Vector Machine for Binary Classificationby Yan Li, Liping ZhangFirst submitted…
Graph Augmentation for Recommendationby Qianru Zhang, Lianghao Xia, Xuheng Cai, Siuming Yiu, Chao Huang, Christian…
FOOL: Addressing the Downlink Bottleneck in Satellite Computing with Neural Feature Compressionby Alireza Furutanpey, Qiyang…
One-Shot Domain Incremental Learningby Yasushi Esaki, Satoshi Koide, Takuro KutsunaFirst submitted to arxiv on: 25…
Symmetric Basis Convolutions for Learning Lagrangian Fluid Mechanicsby Rene Winchenbach, Nils ThuereyFirst submitted to arxiv…
DeepKnowledge: Generalisation-Driven Deep Learning Testingby Sondess Missaoui, Simos Gerasimou, Nikolaos MatragkasFirst submitted to arxiv on:…